Sample Height

The maximum sample/apparatus height that can fit into the scanner enclosure is 710 mm. This height is constant because the sample rotation stage does not move vertically, instead the x-ray source and CMOS flat panel detectors move instead when changing the scanning height. This vertical movement is limited to a range of 260 mm. Depending on the magnification of the sample on the detector, the maximum scannable height of a sample is between 260 and 350 mm.

It should also be noted that, if the height of the sample is much larger than the field of view, there will need to be many scans in the vertical direction to scan the full height. One must be cognizant of this fact because the total scanning time and file size increases linearly for each scan position. It must also be noted that the sample is rotated during scanning, so especially tall and thin samples can wobble during rotation and cause motion artifacts if the sample isn’t rigid enough. All of this should be considered when determining whether the height of the sample needs to be decreased.